Boundary scan equipment

White paper: Improving T/R Module Test Accuracy and Throughput

This white paper provides an overview of the basic building blocks of a phased array system and discusses how the nature of their design leads to a challenging...

Webinar: What you need to know about 5G mmWave device testing

5G NR (New Radio) has pioneered the use of mmWave frequencies that provide large bandwidths. This frequency range 2 (FR2), ranging from 24.25 GHz to 52.6...

Engineer’s Guide to 5G Semiconductor Test

This Whitpaper paper focuses on the new challenges of testing semiconductor devices for wideband 5G applications.The enhanced mobile...

Five techniques for fast, accurate power integrity measurements

Rail voltages are getting smaller, and tolerances are decreasing. As a result, making accurate power rail measurements has become much more difficult....

The Ultimate Guide to Managing Obsolescence in Aerospace and Defense

Test engineers spend as much as 50 percent of their time (or even more in some cases) actively dealing with obsolescence in their test program sets. ...

Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems

ECUs became a standard component in most vehicles. As a computer designed to solve a very specific problem, the ECU is a fundamental component...

Evolution of Weatherproofing Solutions for the Cell Site

Weatherproofing options for coaxial connections at cell sites have changed and expanded along with the cell sites themselves. Today’s more complex...

Designing for EMI testing (step-by-step guide): Improve your time to market with oscilloscopes

Today, R&D engineers face challenging time-to-market goals. Extending the product development schedule and delaying the product launch can prove to...

Power supply control loop response measurements (Bode plot)

To ensure the stability of voltage regulators and switchedmode power supplies, the control loop behavior must be measured and characterized. A well compensating...

Method of implementation (MOI) for IBTA 25+ Gbps serial interface cable test

This application note created by the Test and measurement specialist Rohde & Schwarz and the University of New Hampshire Interoperability Laboratory...

Satellite Systems Testing Your Digital Design

Modern satellite designs need to meet the highest performance requirements in the RF domain and also require a strong focus on digital layout and power...

USB 3.2 Compliance Testing

This webinar is intended for engineers who work on high-speed digital design and test. In particular, we will be focusing at USB interfaces. After...

Advanced Driver Assistance Systems - Test Solutions

As advanced driver assistance systems (ADAS) introduce new technology into vehicles, they need adaptable, futureproof test systems. NI offers a single,...

Published: May 19, 2022

System Level Verification and Debug of DDR3/4 Memory Designs

This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data,...

Test & Measurement / Boundary scan equipment

White paper: Improving T/R Module Test Accuracy and Throughput

Webinar: What you need to know about 5G mmWave device testing

Engineer’s Guide to 5G Semiconductor Test

Five techniques for fast, accurate power integrity measurements

The Ultimate Guide to Managing Obsolescence in Aerospace and Defense

Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems

Evolution of Weatherproofing Solutions for the Cell Site

Designing for EMI testing (step-by-step guide): Improve your time to market with oscilloscopes

Power supply control loop response measurements (Bode plot)

Method of implementation (MOI) for IBTA 25+ Gbps serial interface cable test

Satellite Systems Testing Your Digital Design

USB 3.2 Compliance Testing

Advanced Driver Assistance Systems - Test Solutions

System Level Verification and Debug of DDR3/4 Memory Designs

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